AREA CROP GROWERS WILL WANT TO ATTEND THE UNIVERSITY OF MISSOURI WINTER CROP CONFERENCE TO BE HELD AT THE STONEY CREEK INN LOCATED IN ST. JOSEPH ON THURSDAY, FEBRUARY 18.
PRE-REGISTRATION WILL HELP US PLAN MATERIALS AND MEALS. A FEE WILL BE CHARGED TO COVER LUNCH AND A BOOKLET CONTAINING RESEARCH.
YOU CAN PRE-REGISTER BY CALLING THE HOLT COUNTY EXTENSION OFFICE AT 660-446-3724. CHECK-IN WILL BEGIN AT 8AM WITH THE MEETING STARTING AT 8:15AM.
THE MEETING WILL FEATURE THE LATEST CROP RESEARCH CONDUCTED BY THE UNIVERSITY OF MISSOURI STATE EXTENSION STAFF. THE PROGRAM WILL FOCUS ON COST AND RETURNS OF CROP INPUTS, CROP MANAGEMENT STRATEGIES AND THE IMPACT THAT WEATHER MAY HAVE ON THESE.
THIS MEETING IS SPECIFICALLY TARGETED TO AREA CROP GROWERS.
DR. RAY MASSEY, UNIVERSITY OF MISSOURI AG ECONOMIST, LEAD OFF ON THE PROGRAM TO DISCUSS RISK AND HOW IT RELATES TO INPUT AND CROP PRICES.
NEXT, DR. LAURA SWEETS, EXTENSION PLANT PATHOLOGIST LOOKS AHEAD TO 2010 AND PROVIDES DISEASE MANAGEMENT CONSIDERATIONS FOR THE COMING YEAR.
WEATHER IS ALWAYS ON A GROWERS MIND. PAT GUINAN, MU CLIMATOLOGIST, EXAMINES THE WEATHER OUTLOOK AND WEATHER TOOLS THAT AREA GROWERS HAVE AVAILABLE TO THEM.
WEATHER IMPACTS NITROGEN FERTILIZER MANAGEMENT. DR. PETER SCHARF WILL DISCUSS FERTILIZER DECISION MAKING.
NEW WEED PRODUCTS ARE BEING INTRODUCED INTO THE MARKET PLACE. DR. KEVIN BRADLEY, STATE EXTENSION WEED SCIENTIST, LOOKS AT OPTIONS FOR CORN AND SOYBEAN WEED CONTROL.
ALSO RELATED TO CROP PESTS ARE INSECTS AND THE USE OF DIFFERENT PRODUCTS TO CONTROL CROP PESTS. DR. WAYNE BAILEY, MU ENTOMOLOGISTS, WILL DISCUSS SCOUTING, IMPACT AND MANAGEMENT OF EMERGING INSECT PESTS.
LAST ON THE PROGRAM IS GLYPHOSATE RESISTANCE IN MISSOURI. DR. RAY MASSEY AND DR. KEVIN BRADLEY WILL DISCUSS THE IMPLICATIONS AND CHANGES THAT WILL BE AFFECTING THIS AS WE MANAGE OUR CROPS INTO THE FUTURE.
THE CONFERENCE WILL ADJOURN AT 3PM. FOR MORE INFORMATION, CONTACT WAYNE FLANARY AT 660-446-3724 OR HEATHER BENEDICT AT 660-425-6434, REGIONAL AGRONOMISTS, UNIVERSITY OF MISSOURI EXTENSION.
